Coating and Plating Thickness X-ray Fluorescence (XRF) Spectrometer QTC200S/300/300S

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Product Details

INTRODUCTION

The Coating and Plating X-ray Fluorescence (XRF) Spectrometer series is a widely applicable energy-dispersive XRF tool for non-destructive coating thickness measurement, material analysis, and solution analysis. It is also effective for analyzing coatings on mass-produced parts and printed circuit boards. This series is ideal for quality control, incoming material inspection, and production flow monitoring.

PROPDUCT FEATURES

- High-precision Micro-focus X-ray Tube

- Automatic Crosshair Alignment

- Large/Open Sample Stage

- High-precision XY Sample Stage (optional)

SPECIFICATION

Parameter	Specification
Model	QTC200S/300/300S
Element Analysis Range	From Sulfur (S) to Uranium (U)
Detector	QTC 200S/300: Si-PIN QTC 300S: SDD
Display Mode	Element frequency display
Indicator Display	Display of element detection values
Application	Supports single-layer coating, double-layer coating, alloy coating, electroplating coating
Power Supply	AC 220V ±10%, 50/60Hz (recommended to configure AC purified/stabilized power)
Detection Channels	4096 channels
Testing Time	10~40 seconds
X-ray Tube	High precision micro-focus X-ray tube. High Voltage: 0-50KV (programmable). Tube Current: 0-1mA (programmable).
Current	0-1mA (adjustable range)
Targeting	Tungsten target (W target)
XY Positioning	High precision XY axis positioning
Dimensions	QTC200S: 414416362mm. QTC300/300S: 555573573mm

Coating and Plating Thickness Fluorescence Spectrometer

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Coating and Plating Thickness X-ray Fluorescence (XRF) Spectrometer QTC200S/300/300S

INTRODUCTION

PROPDUCT FEATURES