The Benchtop X-ray Fluorescence (XRF) Spectrometer is a robust analytical instrument designed for precise elemental analysis in laboratory settings. This device excels in various applications, including material composition, quality control, and environmental monitoring.
The benchtop Energy Dispersive X-ray Fluorescence (EDXRF) spectrometer is an X-ray fluorescence analyzer based on energy dispersive detection. EDXRF identifies and quantifies elements by measuring the energy of the fluorescent X-rays emitted from a sample. Unlike Wavelength Dispersive X-ray Fluorescence (WDXRF) spectrometers, EDXRF directly detects the energy distribution of X-rays without using a crystal for wavelength separation.
- Direct Energy Resolution**
Fast analysis speed with high sensitivity.
- High Sensitivity
Detects elements with high sensitivity for accurate results.
- Compact and Portable
Compact design makes it easy to carry and operate in various settings.
| Specification | QSEDX 100A | QSEDX 100B |
| Model | QSEDX 100A | QSEDX 100B |
| Element Analysis Range | From Sulfur (S) to Uranium (U) | From Sulfur (S) to Uranium (U) |
| Element Concentration Analysis Range | From 1 ppm to 99.99% | From 1 ppm to 99.99% |
| Measurement Time | Between 100 to 300 seconds | Between 100 to 300 seconds |
| Detection Limit for Harmful Elements (RoHS) | Up to 1 ppm (limited to Hg, Pb, Cd, Br, Cr, Cl, As, Ba, Sb, etc.) | Up to 1 ppm (limited to Hg, Pb, Cd, Br, Cr, Cl, As, Ba, Sb, etc.) |
| Element Analysis Range (Detailed) | Ti, Cr, Mn, Fe, Co, Ni, Cu, Zn, Se, Nb, Zr, Mo, Pd, Ag, Sn, Sb, Ta, Hf, Re, W, Pb, Bi, etc. | Ti, Cr, Mn, Fe, Co, Ni, Cu, Zn, Se, Nb, Zr, Mo, Pd, Ag, Sn, Sb, Ta, Hf, Re, W, Pb, Bi, etc. |
| Simultaneous Element Analysis | More than dozens of elements and five-layer coatings | More than dozens of elements and five-layer coatings |
| Analysis Detection Limit | Up to 2 ppm; coating analysis can be performed on samples as thin as 0.005 µm | Up to 2 ppm; coating analysis can be performed on samples as thin as 0.005 µm |
| Power Supply | AC 220V ± 5V (it is recommended to configure an AC purified and stabilized power supply) | AC 220V ± 5V (it is recommended to configure an AC purified and stabilized power supply) |
| Typical Coating Thickness | Generally within 30 µm (varies by material) | Generally within 30 µm (varies by material) |
| Selectable Analysis Models | Any number of selectable analysis and identification models | Any number of selectable analysis and identification models |
| Matrix Effect Correction Models | Independent matrix effect correction models are provided | Independent matrix effect correction models are provided |
| Multivariable Nonlinear Regression Program | A multivariable nonlinear regression program is included | A multivariable nonlinear regression program is included |
| Measurement Repeatability | The repeatability of multiple measurements for coating thickness can reach 0.1% | The repeatability of multiple measurements for coating thickness can reach 0.1% |
| Long-term Stability | The long-term working stability for coating thickness measurements can also reach 0.1% | The long-term working stability for coating thickness measurements can also reach 0.1% |
| Energy Resolution | 144 ± 5 electron volts | 129 ± 5 electron volts |
| Temperature Adaptation Range | From 15°C to 30°C | From 15°C to 30°C |
Handheld Alloy X-ray Fluorescence (XRF) Spectrometer QA200/300
Benchtop X-ray Fluorescence (XRF) Spectrometer QSEDX100A/100B
RoHS Compliance X-ray Fluorescence (XRF) Spectrometer QSRoHS-200/300
Coating and Plating Thickness X-ray Fluorescence (XRF) Spectrometer QTC200S/300/300S
QVA200 Vacuum Type X-ray Fluorescence (XRF) Spectrometer (Capable of Detecting Light Elements)
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